Atomic Force Microscopes Manufacturer

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AFMWorkshop
A New Era in Affordable AFM

Highest Resolution Scanning

The HR AFM

With a noise floor of less than 35 picometers, and 28 bit scanning resolution, the HR AFM is capable of measuring the highest resolution images on many types of samples including: polymers, 2-D samples, crystals, ceramics, bio molecules, biomaterials, and semiconductors.

Scanners

  • Easily interchangeable scanners (100 µm, 50 µm, 15 µm) and modes that can be added as your research evolves.

Probe Holder

  • Universal Probe Holder accepts probes from almost all manufacturers.

Software

  • National Instruments LabVIEW Architecture

Optics

  • Research Grade Top and Side View Optics

Open Light Lever

  • Easily visualize alignment
  • Superior feature for instrument innovations/alterations

Applications of the HR AFM

MIT Graduate Student Qian Song Reflects on the HR AFM

Images from the HR AFM Gallery

Some of Our Latest Installations

An American AFM Company supporting research in over 350 Labs worldwide

Get in touch for more information on how the HR AFM can benefit your research needs.