AFMWorkshop
A New Era in Affordable AFM
Highest Resolution Scanning
The HR AFM
With a noise floor of less than 35 picometers, and 28 bit scanning resolution, the HR AFM is capable of measuring the highest resolution images on many types of samples including: polymers, 2-D samples, crystals, ceramics, bio molecules, biomaterials, and semiconductors.
Scanners
- Easily interchangeable scanners (100 µm, 50 µm, 15 µm) and modes that can be added as your research evolves.
Probe Holder
- Universal Probe Holder accepts probes from almost all manufacturers.
Software
- National Instruments LabVIEW Architecture
Optics
- Research Grade Top and Side View Optics
Open Light Lever
- Easily visualize alignment
- Superior feature for instrument innovations/alterations
Applications of the HR AFM





MIT Graduate Student Qian Song Reflects on the HR AFM
Images from the HR AFM Gallery

1 µm × 1µm × 3.5 nm micron scan



3µm × 3µm × 19.8 nm


Courtesy of Masoud Mahjouri Saman, Auburn University

250 × 250 × 1.2 nm scan
Some of Our Latest Installations

















An American AFM Company supporting research in over 350 Labs worldwide
Get in touch for more information on how the HR AFM can benefit your research needs.